Electromigration Concern

Electromigration Concerns
Electromigration Concerns Grow in Advanced Packages – description

The incessant demand for more speed in chips requires forcing more energy through ever-smaller devices, increasing current density and threatening long-term chip reliability. While this problem is we [+13128 chars] – source – Laura Peters https://semiengineering.com/electromigration-concerns-grow-in-advanced-packages/